Test socket "W-CSP"
This is a test socket using a coaxial type four-terminal contact probe!
The "W-CSP" is a testing socket that allows for manual measurements using a coaxial four-terminal contact probe (PATENT) after dicing chips from a wafer. It can be used for chip development, sampling inspections, and failure analysis. The socket cover is detachable and can also be used for automatic machine (handler-type) testing. 【Features】 ■ Capable of functional verification testing for BGA, LGA, and bare chips ■ Capable of measuring the on-resistance of MOS-FETs ■ Capable of measuring voltage between terminals *For more details, please download the PDF or feel free to contact us.
- Company：東洋電子技研 本社・工場
- Price：Other
